Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores by Adham, S., Burek, D., Clark, C.J., Collins, M., Giles, G., Sales, A., Marinissen, E.J., McLaurin, T., Monzel, J., Muradali, F., Rajoki, J., Rajsuman, R., Ricchatti, M., Stannard, D., Udell, J., Varma, P., Whetsel, L., Zamfirescu, A., Zorian, Y.

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