Search Results - Rodekohr, C.L.

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  1. 1
    Realization of Ultra Fine Pitch Traces on LCP Substrates

    Realization of Ultra Fine Pitch Traces on LCP Substrates by Dean, Robert Neal, Weller, Jennifer, Bozack, Mike J., Rodekohr, Chad L., Farrell, Brian, Jauniskis, Linas, Ting, Joseph, Edell, David J., Hetke, Jamille F.

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  2. 2
    Influence of Substrate Surface Roughness on Tin Whisker Growth

    Influence of Substrate Surface Roughness on Tin Whisker Growth by Rodekohr, C.L., Flowers, G.T., Suhling, J.C., Bozack, M.J.

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    Auger Electron Spectroscopic (AES) Measurements on High Aspect Ratio Tin Whiskers

    Auger Electron Spectroscopic (AES) Measurements on High Aspect Ratio Tin Whiskers by Rodekohr, C.L., Flowers, G.T., Suhling, J.C., Bozack, M.J.

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