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Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology
by
Diaz-Fortuny, Javier
,
Saraza-Canflanca, Pablo
,
Romano-Molar, Alex
,
Bury, Erik
,
Degraeve, Robin
,
Kaczer, Ben
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Conference Proceedings
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Array Chip
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Bias Temperature Instabilities
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Computation
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Data Centers
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Degradation
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Electronic Systems
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Multidisciplinary
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Hot Carrier Degradation
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Integrated Circuit Reliability
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Integrated Circuits
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Odometers
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Overclock
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Overclocking
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Physical Sciences
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Physics
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Physics, Applied
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Reliability
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Ring-Oscillator
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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