Applications and Challenges of AI in PCB X-ray Inspection: A Comprehensive Study by Roy, Antika, Al Hasan, Md Mahfuz, Ghosh, Shajib, Varshney, Nitin, Julia, Jake, Forghani, Reza, Asadizanjani, Navid

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Demystifying Edge Cases in Advanced IC Packaging Inspection through Novel Explainable AI Metrics by Ghosh, Shajib, Roy, Antika, Al Hasan, Md Mahfuz, Craig, Patrick, Varshney, Nitin, Koppal, Sanjeev J., Asadizanjani, Navid

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Automated Segmentation of Lymph Nodes on Neck CT Scans Using Deep Learning by Al Hasan, Md Mahfuz, Ghazimoghadam, Saba, Tunlayadechanont, Padcha, Mostafiz, Mohammed Tahsin, Gupta, Manas, Roy, Antika, Peters, Keith, Hochhegger, Bruno, Mancuso, Anthony, Asadizanjani, Navid, Forghani, Reza

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Advancing PCB Assurance Towards Netlist Extraction with the Integration of X-Ray Imaging and Semi-Supervised Learning Techniques by Craig, Patrick, Roy, Antika, Varshney, Nitin, Asadizanjani, Navid

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From Talent Shortage to Workforce Excellence in the CHIPS Act Era: Harnessing Industry 4.0 Paradigms for a Sustainable Future in Domestic Chip Production by Rizi, Aida Damanpak, Antika Roy, Rouhan Noor, Kang, Hyo, Varshney, Nitin, Jacob, Katja, Rivera-Jimenez, Sindia, Edwards, Nathan, Sorger, Volker J, Dalir, Hamed, Asadizanjani, Navid

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Probing the emission dynamics in nitrogen-doped carbon dots by reversible capping with mercury() through surface chemistry by Roy, Dipayan, Das, Antika, Roy, Rajarshi, Das, Dimitra, Kumar Das, Bikram, Ghorai, Uttam Kumar, Chattopadhyay, Kalyan Kumar, Sarkar, Sourav

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