Search Results - Rozdilsky, I.M

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    Focused ion-beam milling for field-ion specimen preparation:: preliminary investigations

    Focused ion-beam milling for field-ion specimen preparation:: preliminary investigations by Larson, D.J, Foord, D.T, Petford-Long, A.K, Anthony, T.C, Rozdilsky, I.M, Cerezo, A, Smith, G.W.D

    Published in Ultramicroscopy
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    Focused ion-beam milling for field-ion specimen preparation

    Focused ion-beam milling for field-ion specimen preparation by Larson, D.J, Foord, D.T, Petford-Long, A.K, Anthony, T.C, Rozdilsky, I.M, Cerezo, A, Smith, G.W.D

    Published in Ultramicroscopy
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