Search Results - Rummel, B.D.

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    Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing

    Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing by Rummel, B.D., Glaser, C.E., Gurule, R.T., Groves, M., Binder, A.T., Floyd, R., Yates, L., Reilly, K.J., Kaplar, R.J.

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