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DC holding and dynamic triggering characteristics of bulk CMOS latchup
by
Rung, R.D.
,
Momose, H.
Published in
IEEE transactions on electron devices
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Determining IC layout rules for cost minimization
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Rung, R.D.
Published in
IEEE journal of solid-state circuits
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A retrograde p-well for higher density CMOS
by
Rung, R.D.
,
Dell'oca, C.J.
,
Walker, L.G.
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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