Search Results - S Al Kharusi

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    Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon by Wagenpfeil, M., Schneider, J., Murra, M., Schulte, D., Weinheimer, C., Michel, T., Anton, G., Adhikari, G., Al Kharusi, S., Angelico, E., Arnquist, I.J., Beck, D., Bolotnikov, A., Breur, P.A., Brown, E., Brunner, T., Caden, E., Chernyak, D., Craycraft, A., Daniels, T., Darroch, L., de St. Croix, A., Deslandes, K., Di Vacri, M.L., Dolinski, M.J., Echevers, J., Elbeltagi, M., Ferrara, S., Feyzbakhsh, S., Gallina, G., Giacomini, G., Gingras, C., Goeldi, D., Gorham, A., Gornea, R., Gratta, G., Hansen, E.V., Hardy, C.A., Heffner, M., Hoppe, E.W., House, A., Jamil, A., Jewell, M., Karelin, A., Kaufman, L.J., Kuchenkov, A., Kumar, K.S., Lan, Y., Leach, K.G., Leonard, D.S., Li, G., Licciardi, C., Lindsay, R., MacLellan, R., Massacret, N., McElroy, T., Medina Peregrina, M., Mong, B., Moore, D.C., Murray, K., Nattress, J., Natzke, C.R., Newby, R.J., Nolet, F., Nusair, O., Nzobadila Ondze, J.C., Odgers, K., Odian, A., Orrell, J.L., Overman, C.T., Piepke, A., Pratte, J.-F., Raguzin, E., Ramonnye, G.J., Retière, F., Richard, C., Richman, M., Ringuette, J., Robinson, A., Rossignol, T., Saldanha, R., Soma, A.K., Spadoni, F., Stekhanov, V., Stiegler, T., Tarka, M., Thibado, S., Tidball, A., Todd, J., Totev, T., Triambak, S., Tsang, R., Viel, S., Vivo-Vilches, C., Walent, M., Worcester, M., Wu, S.X., Yan, W., Yang, L., Zeldovich, O.

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    Search for Majoron-emitting modes of Xe 136 double beta decay with the complete EXO-200 dataset by Al Kharusi, S., Anton, G., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breidenbach, M., Brunner, T., Cao, G. F., Cen, W. R., Chambers, C., Cleveland, B., Coon, M., Craycraft, A., Daniels, T., Darroch, L., Daugherty, S. J., Davis, J., Delaquis, S., Der Mesrobian-Kabakian, A., DeVoe, R., Dilling, J., Dolgolenko, A., Dolinski, M. J., Echevers, J., Fairbank, W., Fairbank, D., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fudenberg, D., Gautam, P., Gornea, R., Gratta, G., Hall, C., Hansen, E. V., Hoessl, J., Hufschmidt, P., Hughes, M., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Johnson, A., Karelin, A., Kaufman, L. J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Lenardo, B. G., Leonard, D. S., Li, G. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., McElroy, T., Michel, T., Mong, B., Moore, D. C., Murray, K., Njoya, O., Nusair, O., Odian, A., Ostrovskiy, I., Perna, A., Piepke, A., Pocar, A., Retière, F., Robinson, A. L., Rowson, P. C., Ruddell, D., Runge, J., Schmidt, S., Sinclair, D., Skarpaas, K., Soma, A. K., Stekhanov, V., Tarka, M., Thibado, S., Todd, J., Tolba, T., Totev, T. I., Tsang, R., Veenstra, B., Veeraraghavan, V., Vogel, P., Vuilleumier, J.-L., Wagenpfeil, M., Watkins, J., Weber, M., Wen, L. J., Wichoski, U., Wrede, G., Wu, S. X.

    Published in Physical review. D
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    Search for MeV electron recoils from dark matter in EXO-200 by Al Kharusi, S., Anton, G., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breidenbach, M., Brunner, T., Cao, G. F., Cen, W. R., Chambers, C., Cleveland, B., Coon, M., Craycraft, A., Daniels, T., Darroch, L., Daugherty, S. J., Davis, J., Delaquis, S., Der Mesrobian-Kabakian, A., DeVoe, R., Dilling, J., Dolgolenko, A., Dolinski, M. J., Echevers, J., Fairbank, W., Fairbank, D., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fu, Y. S., Fudenberg, D., Gautam, P., Gornea, R., Gratta, G., Hall, C., Hansen, E. V., Hoessl, J., Hufschmidt, P., Hughes, M., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Johnson, A., Karelin, A., Kaufman, L. J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Lenardo, B. G., Leonard, D. S., Li, G. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., McElroy, T., Michel, T., Mong, B., Moore, D. C., Murray, K., Njoya, O., Nusair, O., Odian, A., Ostrovskiy, I., Perna, A., Piepke, A., Pocar, A., Retière, F., Robinson, A. L., Rowson, P. C., Ruddell, D., Runge, J., Schmidt, S., Sinclair, D., Skarpaas, K., Soma, A. K., Stekhanov, V., Tarka, M., Thibado, S., Todd, M., Tolba, T., Totev, T. I., Tsang, R. H. M., Veenstra, B., Veeraraghavan, V., Vogel, P., Vuilleumier, J.-L., Wagenpfeil, M., Watkins, J., Wen, L. J., Wichoski, U., Wrede, G., Wu, S. X.

    Published in Physical review. D
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