Thermophysical properties of HgTe and Hg0.9Cd0.1Te melts by Li, C., Su, Ching-Hua, Lehoczky, S.L., Scripa, R.N., Ban, H., Lin, B.

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Thermophysical properties of Hg0.8Cd0.2Te melt : Density, electrical conductivity and viscosity by LI, C, SCRIPA, R. N, BAN, H, LIN, B, SU, C.-H, LEHOCZKY, S. L

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Thermal diffusivity, thermal conductivity, and specific heat capacity measurements of molten tellurium by Zhu, Shen, Li, C., Su, Ching-Hua, Lin, B., Ban, H., Scripa, R.N., Lehoczky, S.L.

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Thermophysical properties of liquid Te: Density, electrical conductivity,and viscosity by Li, C., Su, C.-H., Lehoczky, S. L., Scripa, R. N., Lin, B., Ban, H.

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Analysis of radial segregation in directionally solidified Hg0.89Mn0.11Te by PRICE, M. W, SCRIPA, R. N, SZOFRAN, F. R, MOTAKEF, S, HANSON, B

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Crystal growth of HgZnTe alloy by directional solidification in low gravity environment by Su, Ching-Hua, Sha, Yi-Gao, Lehoczky, S.L., Szofran, F.R., Gillies, D.C., Scripa, R.N., Cobb, S.D., Wang, J.C.

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Crystal growth of selected II-VI semiconducting alloys by directional solidification. Part I Ground-based experiments by SU, C.-H, SHA, Y.-G, LEHOCZKY, S. L, SZOFRAN, F. R, GILLIES, D. C, COBB, S. D, SCRIPA, R. N

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Transient Torque Method: A Fast and Nonintrusive Technique to Simultaneously Determine Viscosity and Electrical Conductivity of Semiconducting and Metallic Melts by Li, C., Ban, H., Lin, B., Scripa, R. N., Su, C.-H., Lehoczky, S. L., Zhu, S.

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Chemical compatibility of vacuum plasma sprayed (VPS) metal cartridges with various semiconductor materials by Scripa, R.N., Wang, B., Gonzalez, A., Holmes, R.R.

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Directional solidification and characterization of Hg0.89Mn0.11Te by Price, M.W, Scripa, R.N, Lehoczky, S.L, Szofran, F.R, Su, Ching-Hua

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Differential thermal analysis of Hg1−xMnxTe alloys in the x=0–0.3 range by Price, M.W., Scripa, R.N., Lehoczky, S.L., Szofran, F.R.

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Chemical compatibility of vacuum plasma sprayed (VPS) metal cartridges with various semiconductor materials by SCRIPA, R. N, WANG, B, GONZALEZ, A, HOLMES, R. R

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Crystal growth of selected II-VI semiconducting alloys by directional solidification. I - Ground-based experiments by Su, Ching-Hua, Sha, Yi-Gao, Lehoczky, S L, Szofran, F R, Gillies, D C, Cobb, S D, Scripa, R N

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Differential thermal analysis of Hg1-xMnxTe alloys in the x = 0-0.3 range by PRICE, M. W, SCRIPA, R. N, LEHOCZKY, S. L, SZOFRAN, F. R

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Directional solidification and characterization of Hg0.89Mn0.11Te by PRICE, M. W, SCRIPA, R. N, LEHOCZKY, S. L, SZOFRAN, F. R, SU, C.-H

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