Energy calibration of superconducting transition edge sensors for x-ray detection using pulse analysis by Hollerith, C., Simmnacher, B., Weiland, R., Feilitzsch, F. v., Isaila, C., Jochum, J., Potzel, W., Höhne, J., Phelan, K., Wernicke, D., May, T.

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X-ray microanalysis with microcalorimeters by Isaila, C., Feilitzsch, F.v., Höhne, J., Hollerith, C., Phelan, K., Simmnacher, B., Weiland, R., Wernicke, D.

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Semiconductor material analysis based on microcalorimeter EDS by Simmnacher, B., Weiland, R., Höhne, J., Feilitzsch, F.v., Hollerith, C.

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The Microcalorimeter for Industrial Applications by Redfern, Del, Nicolosi, Joe, Höhne, Jens, Weiland, Rainer, Simmnacher, Birgit, Hollerich, Christian

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Analytical tools for the characterization of power devices by SCHULZE, H.-J, FROHNMEYER, A, NIEDERNOSTHEIDE, F.-J, SIMMNACHER, B, KOLBESEN, B. O, TÜTTO, P, PAVELKA, T, WACHUTKA, G

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Energy dispersive X-ray spectroscopy with microcalorimeters by Hollerith, C., Wernicke, D., Bühler, M., Feilitzsch, F.v., Huber, M., Höhne, J., Hertrich, T., Jochum, J., Phelan, K., Stark, M., Simmnacher, B., Weiland, W., Westphal, W.

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Analysis of the carrier and temperature distributions in gate turn-off thyristors by internal laser deflection by Simmnacher, B., Deboy, G., Ruff, M., Schulze, H.-J., Kolbesen, B.

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Cryogenic detector systems for materials analysis by Hoehne, J, Hess, U, Buehler, M, v Feilitzsch, F, Jochum, J, v Hentig, R, Hertrith, T, Hollerith, C, Huber, M, Nikolosi, J

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Cryogenic detector systems for materials analysis by Hohne, J., Buhler, M., Feilitzsch, F.V., Jochum, J., Hertrich, T., Hollerith, C., Huber, M., Nicolosi, J., Phelan, K., Redfern, D., Simmnacher, B., Weiland, R., Wernicke, D.

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