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Search Results - SUNGAUER, E
Search Results - SUNGAUER, E
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Plasma etching of HfO2 in metal gate CMOS devices
by
SUNGAUER, E
,
MELLHAOUI, X
,
PARGON, E
,
JOUBERT, O
Published in
Microelectronic engineering
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Plasma etching of HfO@@d2@ in metal gate CMOS devices
by
Sungauer, E
,
Mellhaoui, X
,
Pargon, E
,
Joubert, O
Published in
Microelectronic engineering
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Plasma etching of HfO 2 in metal gate CMOS devices
by
Sungauer, E.
,
Mellhaoui, X.
,
Pargon, E.
,
Joubert, O.
Published in
Microelectronic engineering
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Etching mechanisms of HfO2, SiO2, and poly-Si substrates in BCl3 plasmas
by
Sungauer, E.
,
Pargon, E.
,
Mellhaoui, X.
,
Ramos, R.
,
Cunge, G.
,
Vallier, L.
,
Joubert, O.
,
Lill, T.
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Etching mechanisms of Hf O 2 , Si O 2 , and poly-Si substrates in B Cl 3 plasmas
by
Sungauer, E.
,
Pargon, E.
,
Mellhaoui, X.
,
Ramos, R.
,
Cunge, G.
,
Vallier, L.
,
Joubert, O.
,
Lill, T.
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Microelectronic Engineering
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Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
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Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures Processing, Measurement, And Phenomena
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Engineering
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Metal Gate
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Nanoscience & Nanotechnology
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Physical Sciences
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Physics
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Physics, Applied
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Plasma Etching
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Science & Technology
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Applied Sciences
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Atomic And Molecular Physics, And Optics
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Bcl
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Bcl 3
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Design. Technologies. Operation Analysis. Testing
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Electrical And Electronic Engineering
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Elsevier Sciencedirect Journals
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Elsevier
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Aip Digital Archive
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Aip 美国物理联合会现刊(与Nstl共建)
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Sciencedirect Journals
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Backfile Package - Materials Science [Yms]
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Backfile Package - Physics General (Legacy) [Ypa]
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