Design, Modeling, and Simulation of a New Nanoelectromechanical Switch for Low-Power Applications by Han, Sijing, Saab, Daniel G., Tabib-Azar, Massood

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Exact Path Delay Fault Coverage Calculation of Partitioned Circuits by Kocan, F., Lun Li, Saab, D.G.

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Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware by Kocan, Fatih, Saab, Daniel G

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Dynamic fault diagnosis on reconfigurable hardware by Kocan, Fatih, Saab, Daniel G

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Combining multiple DFT schemes with test generation by Mathew, B., Saab, D.G.

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Verifying properties using sequential ATPG [IC design] by Abraham, J.A., Vedula, V.M.

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Structural and behavioral synthesis for testability techniques by Chung-Hsing Chen, Karnik, T., Saab, D.G.

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Ultra-low power NEMS FPGA by Han, Sijing, Sirigiri, Vijay, Saab, Daniel G., Tabib-Azar, Massood

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Initialization of Sequential Circuits and its Application to ATPG by Wehbeh, Jalal A, Saab, Daniel G

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A novel behavioral testability measure by Chung-Hsing Chen, Saab, D.G.

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Circuit simulation for Nano-Electro-Mechanical switches VLSI circuits by Alzoubi, K, Saab, D G, Tabib-Azar, M

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Partial Reset: An Alternative DFT Approach by Mathew, Ben, Saab, Daniel G.

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Benchmarking parallel processing platforms: an applications perspective by Mueller-Thuns, R.B., Saab, D.G., Damiano, R.F., Abraham, J.A.

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Switch-level timing simulation of bipolar ECL circuits by Yang, A.T., Chang, Y.-H., Saab, D.G., Hajj, I.N.

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Concurrent D-algorithm on reconfigurable hardware by Kocan, F., Saab, D.G.

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ATPG for combinational circuits on configurable hardware by Kocan, F., Saab, D.G.

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Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms by Saab, D.G., Saab, Y.G., Abraham, J.A.

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HDL Program Slicing to Reduce Bounded Model Checking Search Overhead by Jen-Chieh Ou, Saab, D.G., Abraham, J.A.

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Concurrent Hierarchical and Multilevel Simulation of VLSI Circuits by Mueller-Thuns, Robert B., Rahmeh, Joseph T., Abraham, Jacob A., Wehbeh, Jalal A., Saab, Daniel G.

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Checking nested properties using bounded model checking and sequential ATPG by Qiang Qiang, Saab, D.G., Abraham, J.A.

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