Search Results - Saenger, M.F.

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    Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

    Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells by SAENGER, M. F, SUN, J, SCHÄDEL, M, HILFIKER, J, SCHUBERT, M, WOOLLAM, J. A

    Published in Thin solid films
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    Spectroscopic ellipsometry characterization of SiN x antireflection films on textured multicrystalline and monocrystalline silicon solar cells

    Spectroscopic ellipsometry characterization of SiN x antireflection films on textured multicrystalline and monocrystalline silicon solar cells by Saenger, M.F., Sun, J., Schädel, M., Hilfiker, J., Schubert, M., Woollam, J.A.

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    Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

    Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry by Jianing Sun, Saenger, M.F., Schubert, M., Hilfiker, J.N., Synowicki, R., Herzinger, C.M., Woollam, J.A.

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    X-linked nephrogenic diabetes insipidus: from the ship Hopewell to RFLP studies

    X-linked nephrogenic diabetes insipidus: from the ship Hopewell to RFLP studies by Bichet, D G, Hendy, G N, Lonergan, M, Arthus, M F, Ligier, S, Pausova, Z, Kluge, R, Zingg, H, Saenger, P, Oppenheimer, E

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