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Thermal cycling fatigue analysis of copper pillar-to-solder joint reliability
by
Pang, J.H.L.
,
Wong, S.C.K.
,
Sai Kiat Neo
,
Kok Ee Tan
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Conference Proceeding
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Conference Proceedings
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Subjects
Assembly
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Computer Science
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Computer Science, Hardware & Architecture
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Computer Science, Information Systems
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Copper
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Copper Pillar
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Cte Mismatch
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Design Methodology
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Encapsulation
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Engineering
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Engineering, Electrical & Electronic
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Fatigue
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Flip Chip
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Parametric Study
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Pin-Head Interconnect
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Science & Technology
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Solder Joint Reliability
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Soldering
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Technology
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Telecommunications
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Ieee Electronic Library (Iel) Conference Proceedings
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