Search Results - Sakakidani, Akihito

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    (Invited) Characterization of Oxide Traps Participating in Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs

    (Invited) Characterization of Oxide Traps Participating in Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs by Tsuchiya, Toshiaki, Tamura, Naoyoshi, Sakakidani, Akihito, Sonoda, Kenichiro, Kamei, Masayuki, Yamakawa, Shinya, Kuwabara, Sumio

    Published in ECS transactions
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