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    Simplistic Simulation-Based Device-VT-Targeting Technique to Determine Technology High-Density LELE-Gate-Patterned FinFET SRAM in Sub-10 nm Era

    Simplistic Simulation-Based Device-VT-Targeting Technique to Determine Technology High-Density LELE-Gate-Patterned FinFET SRAM in Sub-10 nm Era by Sakhare, Sushil Sudam, Miyaguchi, Kenichi, Raghavan, Praveen, Mercha, Abdelkarim

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