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Feedforward Run-to-Run Control for Reduced Parametric Transistor Variation in CMOS Logic 0.13 [Formula Omitted] Technology
by
Jedidi, Nader
,
Sallagoity, Pascal
,
Roussy, Agnés
,
Dauzere-Peres, Stéphane
Published in
IEEE transactions on semiconductor manufacturing
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Probing impact on pad moisture tightness: A challenge for pad size reduction
by
Vidal-Dho, Matthias
,
Hubert, Quentin
,
Gonon, Patrice
,
Delorme, Philippe
,
Jacquot, Jonathan
,
Marchetti, Maxime
,
Beauvisage, Ludovic
,
Moragues, Jean-Michel
,
Potard, Pascale
,
Fornara, Pascal
,
Escales, Jean-Philippe
,
Sallagoity, Pascal
,
Pizzuto, Olivier
,
Maury, Delphine
,
Mirabel, Jean-Michel
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Feedforward Run-to-Run Control for Reduced Parametric Transistor Variation in CMOS Logic 0.13 μm Technology
by
JEDIDI, Nader
,
SALLAGOITY, Pascal
,
ROUSSY, Agnes
,
DAUZERE-PERES, Stéphane
Published in
IEEE transactions on semiconductor manufacturing
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Feedforward Run-to-Run Control for Reduced Parametric Transistor Variation in CMOS Logic 0.13 \mu Technology
by
Jedidi, Nader
,
Sallagoity, Pascal
,
Roussy, Agnés
,
Dauzere-Peres, Stéphane
Published in
IEEE transactions on semiconductor manufacturing
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Feed-forward run-to-run control for reduced parametric transistor variation in CMOS logic 0.13μm technology
by
Jedidi, N.
,
Sallagoity, P.
,
Roussy, A.
,
Dauzere-Peres, S.
,
Pinaton, J.
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Résumés de thèse
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Bouché, par Michel
,
Sallagoity, par Pascal
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Harito Shteto, par Milena
,
Demange, par Dominique
,
Gilbert, par Henri
,
Gesbert, par David
,
Maury, par Delphine
,
Gaillard, par Frédéric
Published in
Annales des télécommunications
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