Search Results - Sammann, Ernie

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  1. 1
    Hierarchically textured LixMn2−yO4 thin films as positive electrodes for lithium-ion batteries

    Hierarchically textured LixMn2−yO4 thin films as positive electrodes for lithium-ion batteries by Bettge, Martin, Ryu, Seung Yoon, MacLaren, Scott, Burdin, Steve, Petrov, Ivan, Yu, Min-Feng, Sammann, Ernie, Abraham, Daniel P.

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  2. 2
    Ion-induced surface relaxation: controlled bending and alignment of nanowire arrays

    Ion-induced surface relaxation: controlled bending and alignment of nanowire arrays by Bettge, Martin, MacLaren, Scott, Burdin, Steve, Haasch, Richard T, Abraham, Daniel, Petrov, Ivan, Yu, Min-Feng, Sammann, Ernie

    Published in Nanotechnology
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  3. 3
    Low-temperature vapour–liquid–solid (VLS) growth of vertically aligned silicon oxide nanowires using concurrent ion bombardment

    Low-temperature vapour–liquid–solid (VLS) growth of vertically aligned silicon oxide nanowires using concurrent ion bombardment by Bettge, Martin, MacLaren, Scott, Burdin, Steve, Wen, Jian-Guo, Abraham, Daniel, Petrov, Ivan, Sammann, Ernie

    Published in Nanotechnology
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  4. 4
    Hierarchically textured Li Mn2−O4 thin films as positive electrodes for lithium-ion batteries

    Hierarchically textured Li Mn2−O4 thin films as positive electrodes for lithium-ion batteries by Bettge, Martin, Ryu, Seung Yoon, MacLaren, Scott, Burdin, Steve, Petrov, Ivan, Yu, Min-Feng, Sammann, Ernie, Abraham, Daniel P.

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  5. 5
    Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires

    Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires by Bettge, Martin, MacLaren, Scott, Burdin, Steve, Abraham, Daniel, Petrov, Ivan, Yu, Min-Feng, Sammann, Ernie

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  6. 6
    The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

    The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois by Wen, Jianguo, Mabon, James, Lei, Changhui, Burdin, Steve, Sammann, Ernie, Petrov, Ivan, Shah, Amish B., Chobpattana, Varistha, Zhang, Jiong, Ran, Ke, Zuo, Jian-Min, Mishina, Satoshi, Aoki, Toshihiro

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