Search Results - Sandu, I.C.A.

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    Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring

    Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring by Pereira, C., Ferreira, I.M.P.L.V.O., Branco, L.C., Sandu, I.C.A., Busani, T.

    Published in Procedia chemistry
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