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A simple closed-form expression for the X-ray reflectivity from multilayers with cumulative roughness
by
Kelly, David M.
,
Fullerton, Eric E.
,
Santa-Maria, Jacobo
,
Schuller, Ivan K.
Published in
Scripta metallurgica et materialia
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Scripta Metallurgica Et Materialia
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Subjects
Absorption
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Applied Sciences
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Condensed Matter: Electronic Structure, Electrical, Magnetic, And Optical Properties
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Crystal Structure
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Exact Sciences And Technology
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Interfaces
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Layers
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Materials Science
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Materials Science, Multidisciplinary
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Mathematical Models
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Metallurgy & Metallurgical Engineering
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Metals And Metallic Alloys
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Metals. Metallurgy
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Morphology
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Optical Properties Of Specific Thin Films
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Physics
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Reflectivity
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Refraction
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Roughness
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Science & Technology
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Elsevier Sciencedirect Journals
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Elsevier:jisc Collections:elsevier Read And Publish Agreement 2022-2024:Freedom Collection (Reading List)
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Backfile Package - Materials Science [Yms]
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