Search Results - Sato-Iwanaga, J.

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  1. 1
    Numerical Study of Flicker Noise in p-Type [Formula Omitted] Heterostructure MOSFETs

    Numerical Study of Flicker Noise in p-Type [Formula Omitted] Heterostructure MOSFETs by Chen, Chia-Yu, Yang, Liu, Dutton, R W, Sato-Iwanaga, J, Inoue, A, Sorada, H

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  2. 2
    Low-frequency noise characteristics in SiGe channel heterostructure dynamic threshold pMOSFET (HDTMOS)

    Low-frequency noise characteristics in SiGe channel heterostructure dynamic threshold pMOSFET (HDTMOS) by Asai, A., Sato-Iwanaga, J., Inoue, A., Hara, Y., Kanzawa, Y., Sorada, H., Kawashima, T., Ohnishi, T., Takagi, T., Kubo, M.

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  3. 3
    Device simulation for RF applications

    Device simulation for RF applications by Dutton, R.W., Troyanovsky, B., Yu, Z., Arnborg, T., Rotella, F., Ma, G., Sato-Iwanaga, J.

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  4. 4
    Distortion analysis of GaAs MESFETs based on physical model using PISCES-HB

    Distortion analysis of GaAs MESFETs based on physical model using PISCES-HB by Sato-Iwanaga, J., Fujimoto, K., Masato, H., Ota, Y., Inoue, K., Troyanovsky, B., Yu, Z., Dutton, R.W.

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  5. 5
    Robust and efficient AC analysis of high-speed devices

    Robust and efficient AC analysis of high-speed devices by Ke-Chih Wu, Zhiping Yu, So, Dutton, Sato-Iwanaga

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