Search Results - Saugnon, D.

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Impact of RF stress on different topologies of 100 nm X-band robust GaN LNA

    Impact of RF stress on different topologies of 100 nm X-band robust GaN LNA by Pinault, B., Tartarin, J.G., Saugnon, D., Leblanc, R.

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  2. 2
    Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging

    Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging by Tartarin, J.G., Lazar, O., Saugnon, D., Lambert, B., Moreau, C., Bouexiere, C., Romain-Latu, E., Rousseau, K., David, A., Roux, J.L.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental tools - Electrical and T-CAD models

    Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental tools - Electrical and T-CAD models by Tartarin, J.G., Saugnon, D., Graffeuil, J., Bary, L.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: