Search Results - Scafidi, Pascal

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    Advanced backside failure analysis in 65 nm CMOS technology

    Advanced backside failure analysis in 65 nm CMOS technology by Bianic, Stephane, Allemand, Stéphanie, Kerrosa, Grégory, Scafidi, Pascal, Renard, Didier

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    Advanced backside failure analysis in 65nm CMOS technology

    Advanced backside failure analysis in 65nm CMOS technology by Bianic, Stephane, Allemand, Stéphanie, Kerrosa, Grégory, Scafidi, Pascal, Renard, Didier

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    AllergoOncology: Biomarkers and refined classification for research in the allergy and glioma nexus—A joint EAACI‐EANO position paper

    AllergoOncology: Biomarkers and refined classification for research in the allergy and glioma nexus—A joint EAACI‐EANO position paper by Turner, Michelle C., Radzikowska, Urszula, Ferastraoaru, Denisa E., Pascal, Mariona, Wesseling, Pieter, McCraw, Alexandra, Backes, Claudine, Bax, Heather J., Bergmann, Christoph, Bianchini, Rodolfo, Cari, Luigi, de las Vecillas, Leticia, Izquierdo, Elena, Lind‐Holm Mogensen, Frida, Michelucci, Alessandro, Nazarov, Petr V., Niclou, Simone P., Nocentini, Giuseppe, Ollert, Markus, Preusser, Matthias, Rohr‐Udilova, Nataliya, Scafidi, Andrea, Toth, Reka, Van Hemelrijck, Mieke, Weller, Michael, Jappe, Uta, Escribese, Maria M., Jensen‐Jarolim, Erika, Karagiannis, Sophia N., Poli, Aurélie

    Published in Allergy (Copenhagen)
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