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Search Results - Schligtenhorst, H.
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Mismatch in diffusion resistors caused by photolithography
by
Hausser, S.
,
Majoni, S.
,
Schligtenhorst, H.
,
Kolwe, G.
Published in
IEEE transactions on semiconductor manufacturing
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Alternatives for gold killing of bipolar switching transistors
by
Schligtenhorst, H.
,
Hurkx, G.A.M.
,
Schroeder, H.
,
Sievers, B.
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Test structures for the characterization of deep trench isolation [The following paper has been withdrawn by the authors]
by
Hausser, S.
,
Albus, R.
,
Schligtenhorst, H.
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Study and Optimization of Bipolar Power Transistors using Mixed-Mode Simulations
by
Schligtenhorst, H.
,
Hurkx, G.A.M.
,
Notley, R.
,
Huang, E.
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A-BCD: An economic 100 V RESURF silicon-on-insulator BCD technology for consumer and automotive applications
by
van der Pol, J.A.
,
Ludikhuize, A.W.
,
Huizing, H.G.A.
,
van Velzen, B.
,
Hueting, R.J.E.
,
Mom, J.F.
,
van Lijnschoten, G.
,
Hessels, G.J.J.
,
Hooghoudt, E.F.
,
van Huizen, R.
,
Swanenberg, M.J.
,
Egbers, J.H.H.A.
,
van den Elshout, F.
,
Koning, J.J.
,
Schligtenhorst, H.
,
Soeteman, J.
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A-BCD: An economic 100V RESURF Silicon-On-Insulator BCD Technology for consumer and automotive applications
by
VAN DER POL, Jacob A
,
LUDIKHUIZE, A. W
,
SWANENBERG, M. J
,
EGBERS, J. H. H. A
,
VAN DEN ELSHOUT, F
,
KONING, J. J
,
SCHLIGTENHORST, H
,
SOETEMAN, J
,
HUIZING, H. G. A
,
VANVELZEN, B
,
HUETING, R. J. E
,
MOM, J. F
,
VAN LIJNSCHOTEN, G
,
HESSELS, G. J. J
,
HOOGHOUDT, E. F
,
VAN HUIZEN, R
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