On Acceleration of SAT-Based ATPG for Industrial Designs by Drechsler, R., Eggersgluss, S., Fey, G., Glowatz, A., Hapke, F., Schloeffel, J., Tille, D.

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Defect-oriented cell-internal testing by Hapke, F, Redemund, W, Schloeffel, J, Krenz-Baath, R, Glowatz, A, Wittke, M, Hashempour, H, Eichenberger, S

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Cell-aware analysis for small-delay effects and production test results from different fault models by Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J.

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Cell-aware Production test results from a 32-nm notebook processor by Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J.

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Modeling and analysis of crosstalk coupling effect on the victim interconnect using the ABCD network model by Palit, A.K., Meyer, V., Anheier, W., Schloeffel, J.

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A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips by Palit, A.K., Lei Wu, Duganapalli, K.K., Anheier, W., Schloeffel, J.

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Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs by Hapke, F., Krenz-Baath, R., Glowatz, A., Schloeffel, J., Hashempour, H., Eichenberger, S., Hora, C., Adolfsson, D.

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Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates by Hapke, F., Schloeffel, J.

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Resistive Bridging Fault Simulation of Industrial Circuits by Engelke, P., Polian, I., Schloeffel, J., Becker, B.

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Programmable deterministic Built-In Self-Test by Hakmi, A.-W., Wunderlich, H.-J., Zoellin, C.G., Glowatz, A., Hapke, F., Schloeffel, J., Souef, L.

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Fault detection and diagnosis with parity trees for space compaction of test responses by Vranken, Harald, Goel, Sandeep Kumar, Glowatz, Andreas, Schloeffel, Juergen, Hapke, Friedrich

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ABCD modeling of crosstalk coupling noise to analyze the signal integrity losses on the victim interconnect in DSM chips by Palit, A.K., Meyer, V., Anheier, W., Schloeffel, J.

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Analysis of crosstalk coupling effects between aggressor and victim interconnect using two-port network model by Palit, A.K., Meyer, V., Anheier, W., Schloeffel, J.

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Gate-Exhaustive and Cell-Aware pattern sets for industrial designs by Hapke, F, Schloeffel, J, Hashempour, H, Eichenberger, S

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Cell-aware experiences in a high-quality automotive test suite by Hapke, F., Arnold, R., Beck, M., Baby, M., Straehle, S., Goncalves, J. F., Panait, A., Behr, R., Maugard, G., Prashanthi, A., Schloeffel, J., Redemund, W., Glowatz, A., Fast, A., Rajski, J.

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Computation and Application of Absolute Dominators in Industrial Designs by Krenz Baath, R., Glowatz, A., Schloeffel, J.

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Deterministic Logic BIST for Transition Fault Testing by Gherman, V., Wunderlich, H.-J., Schloeffel, J., Garbers, M.

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Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults by EggersgluB, Stephan, Fey, Gorschwin, Drechsler, Rolf, Glowatz, Andreas, Hapke, Friedrich, Schloeffel, Juergen

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Human Tick-Borne Diseases in Australia by Dehhaghi, Mona, Kazemi Shariat Panahi, Hamed, Holmes, Edward C, Hudson, Bernard J, Schloeffel, Richard, Guillemin, Gilles J

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Could the kynurenine pathway be the key missing piece of Myalgic Encephalomyelitis/Chronic Fatigue Syndrome (ME/CFS) complex puzzle? by Kavyani, Bahar, Lidbury, Brett A., Schloeffel, Richard, Fisher, Paul R., Missailidis, Daniel, Annesley, Sarah J., Dehhaghi, Mona, Heng, Benjamin, Guillemin, Gilles J.

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