Search Results - Schuermyer, C.

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  1. 1
    Impact of multiple-detect test patterns on product quality

    Impact of multiple-detect test patterns on product quality by Benware, B., Schuermyer, C., Tamarapalli, N., Kun-Han Tsai, Ranganathan, S., Madge, R., Rajski, J., Krishnamurthy, P.

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  2. 2
    In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

    In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost by Madge, R., Benware, B., Turakhia, R., Daasch, R., Schuermyer, C., Ruffler, J.

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  3. 3
    Screening minVDD outliers using feed-forward voltage testing

    Screening minVDD outliers using feed-forward voltage testing by Madge, R., Goh, B.H., Rajagopalan, V., Macchietto, C., Daasch, R., Schuermyer, C., Taylor, C., Turner, D.

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  4. 4
    Identifying systematic critical features using silicon diagnosis data

    Identifying systematic critical features using silicon diagnosis data by Schuermyer, C., Malik, S., Herrmann, T.

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  5. 5
    Minimum testing requirements to screen temperature dependent defects

    Minimum testing requirements to screen temperature dependent defects by Schuermyer, C., Ruffler, J., Daasch, R., Madge, R.

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  6. 6
    Achieving higher yield through diagnosis-the ASIC perspective

    Achieving higher yield through diagnosis-the ASIC perspective by Schuermyer, C.

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  7. 7
    A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

    A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis by Keim, M., Tamarapalli, N., Tang, H., Sharma, M., Rajski, J., Schuermyer, C., Benware, B.

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  8. 8
    A Hybrid Flow for Memory Failure Bitmap Classification

    A Hybrid Flow for Memory Failure Bitmap Classification by Jianbo Li, Yu Huang, Wu-Tung Cheng, Schuermyer, C., Dong Xiang, Faehn, E., Farrugia, R.

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  9. 9
    Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

    Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results by Benware, B., Schuermyer, C., Sharma, M., Herrmann, T.

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  10. 10
    Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis

    Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis by Schuermyer, C., Cota, K., Madge, R., Benware, B.

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  11. 11
    Extracting Defect Density and Size Distributions from Product ICs

    Extracting Defect Density and Size Distributions from Product ICs by Nelson, J.E., Zanon, T., Brown, J.G., Poku, O., Blanton, R.D., Maly, W., Benware, B., Schuermyer, C.

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  12. 12
    Silicon Evaluation of Static Alternative Fault Models

    Silicon Evaluation of Static Alternative Fault Models by Schuermyer, C., Pangilinan, J., Jahangiri, J., Keim, M., Rajski, J., Benware, B.

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  13. 13
    Screening vdsm outliers using nominal and subthreshold supply voltage I/sub DDQ

    Screening vdsm outliers using nominal and subthreshold supply voltage I/sub DDQ by Schuermyer, C., Benware, B., Cota, K., Madge, R., Daasch, R., Ning, L.

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  14. 14
    A supervised ANN method for memory failure signature classification

    A supervised ANN method for memory failure signature classification by Jianbo Li, Yu Huang, Wu-Tung Cheng, Schuermyer, C., Dong Xiang

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