Search Results - Schumi-Mareček, David

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    Millisecond X‐ray reflectometry and neural network analysis: unveiling fast processes in spin coating

    Millisecond X‐ray reflectometry and neural network analysis: unveiling fast processes in spin coating by Schumi-Mareček, David, Bertram, Florian, Mikulík, Petr, Varshney, Devanshu, Novák, Jiří, Kowarik, Stefan

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