Search Results - Schvittz, R. B.

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  1. 1
    Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

    Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation by Schvittz, R.B., Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Rosa, L.S., Butzen, P.F.

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  2. 2
    Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs

    Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs by Oliveira, I.F.V., Schvittz, R.B., Butzen, P.F.

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  3. 3
    Reliability evaluation of circuits designed in multi- and single-stage versions

    Reliability evaluation of circuits designed in multi- and single-stage versions by Schvittz, R. B., Pontes, M., Meinhardt, C., Franco, D. T., Naviner, L., da Rosa, L. S., Butzen, P. F.

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  4. 4
    Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems

    Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems by Balen, Tiago R., González, Carlos J., Oliveira, Ingrid F. V., da Rosa Jr, Leomar S., Soares, Rafael I., Schvittz, Rafael B., Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Guazzelli, Marcilei A., Medina, Nilberto H., Butzen, Paulo F.

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