Search Results - Scire, Fredric

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  1. 1
    The Topografiner: An Instrument for Measuring Surface Microtopography

    The Topografiner: An Instrument for Measuring Surface Microtopography by Young, Russell, Ward, John, Scire, Fredric

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  2. 2
    Piezodriven 50‐μm range stage with subnanometer resolution

    Piezodriven 50‐μm range stage with subnanometer resolution by Scire, Fredric E., Teague, E. Clayton

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  3. 3
    Three-dimensional stylus profilometry

    Three-dimensional stylus profilometry by Teague, E.Clayton, Scire, Fredric E., Baker, Saul M., Jensen, Stephen W.

    Published in Wear
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  4. 4
    Para‐flex stage for microtopographic mapping

    Para‐flex stage for microtopographic mapping by Teague, E. Clayton, Young, Russell D., Scire, Fredric, Gilsinn, David

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  5. 5
    Sinusoidal profile precision roughness specimens

    Sinusoidal profile precision roughness specimens by Teague, E.Clayton, Scire, Fredric E., Vorburger, Theodore V.

    Published in Wear
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  6. 6
    Precision reference specimens of surface roughness: Some characteristics of the cali-block

    Precision reference specimens of surface roughness: Some characteristics of the cali-block by Young, Russell D., Scire, Fredric E.

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