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Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
by
Miura, Katsuyoshi
,
Seko, Atsuki
,
Nakamae, Koji
Published in
Microelectronics and reliability
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Microelectronics And Reliability
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Arbiter Puf
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Authentication
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Encryption
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Engineering
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Time-Resolved Emission Microscope
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