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Lock-in Thermography for the Localization of Security Hard Blocks on SoC Devices
by
Kögel, Michael
,
Brand, Sebastian
,
Große, Christian
,
Altmann, Frank
,
Selmke, Bodo
,
Zinnecker, Kilian
,
Hesselbarth, Robert
,
Jacob Kabakci, Nisha
Published in
Journal of failure analysis and prevention
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Journal Of Failure Analysis And Prevention
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Practical Failure Analysis
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Characterization And Evaluation Of Materials
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