Search Results - Seow, T.X.F.

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    A dimensional investigation of error-related negativity (ERN) and self-reported psychiatric symptoms

    A dimensional investigation of error-related negativity (ERN) and self-reported psychiatric symptoms by Seow, T.X.F., Benoit, E., Dempsey, C., Jennings, M., Maxwell, A., McDonough, M., Gillan, C.M.

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