Search Results - Sezgin-Ugranlı, Hatice Gül

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    Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes

    Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes by Sezgin-Ugranli, Hatice Gul, Ozcelep, Yasin

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    A New Approach for VDMOSFETs' Gate Oxide Degradation Based on Capacitance and Subthreshold Current Measurements Under Constant Electrical Stress

    A New Approach for VDMOSFETs' Gate Oxide Degradation Based on Capacitance and Subthreshold Current Measurements Under Constant Electrical Stress by Sezgin-Ugranli, Hatice Gul, Ozcelep, Yasin

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    Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress

    Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress by Sezgin-Ugranlı, Hatice Gül, Özçelep, Yasin

    Published in Microelectronics
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