Fermi level pinning by defects in HfO2-metal gate stacks by Robertson, J., Sharia, O., Demkov, A. A.

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Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- k Gate Stacks by Bersuker, G, Chang Seo Park, Huang-Chun Wen, Choi, K, Price, J, Lysaght, P, Hsing-Huang Tseng, Sharia, O, Demkov, A, Ryan, J T, Lenahan, P

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Radiation defects in complex perovskite solid solutions by Kuklja, M.M., Kotomin, E.A., Sharia, O., Mastrikov, Yu.A., Maier, J.

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Modeling complexity of a complex gate oxide by Demkov, Alexander A., Sharia, O., Luo, X., Bersuker, G., Robertson, J.

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Theoretical analysis of high-k dielectric gate stacks by Demkov, A.A., Sharia, O., Lee, J.K.

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Extended Frenkel pairs and band alignment at metal-oxide interfaces by Sharia, O., Tse, K., Robertson, J., Demkov, Alexander A.

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Fermi level pinning by defects in Hf O 2 -metal gate stacks by Robertson, J., Sharia, O., Demkov, A. A.

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Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- [Formula Omitted] Gate Stacks by Bersuker, Gennadi, Park, Chang Seo, Wen, Huang-Chun, Choi, K, Price, Jimmy, Lysaght, Patrick, Tseng, Hsing-Huang, Sharia, O, Demkov, Alex, Ryan, Jason T, Lenahan, P

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Origin of the flat-band voltage (Vfb) roll-off phenomenon in metal/high-k gate stacks by Bersuker, G., Park, C.S., Wen, H.C., Choi, K., Sharia, O., Demkov, A.

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Immunohistochemical Characterization of Leukocytic Subpopulations in Chronic Endometritis by Tawfik, O, Venuti, S, Brown, S, Collins, J

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