Search Results - Sharifi, Shamin H

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  1. 1
    Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

    Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution by Van Beek, Simon, Rao, Siddharth, Kundu, Shreya, Kim, Woojin, O'Sullivan, Barry J., Cosemans, Stefan, Yasin, Farukh, Carpenter, Robert, Couet, Sebastien, Sharifi, Shamin H., Jossart, Nico, Crotti, Davide, Kar, Gouri

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  2. 2
    La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications

    La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications by Walke, Amey M., Popovici, Mihaela I., Sharifi, Shamin H., Demir, Eyup C., Puliyalil, Harinarayanan, Bizindavyi, Jasper, Yasin, Farrukh, Clima, Sergiu, Fantini, Andrea, Belmonte, Attilio, Kar, Gouri S., Houdt, Jan V.

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  3. 3
    10¹²) for FeRAM Applications

    10¹²) for FeRAM Applications by Walke, Amey M, Popovici, Mihaela I, Sharifi, Shamin H, Demir, Eyup C, Harinarayanan Puliyalil, Bizindavyi, Jasper, Yasin, Farrukh, Clima, Sergiu, Fantini, Andrea, Belmonte, Attilio, Kar, Gouri S, Houdt, Jan V

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