Polarized photoluminescence of nc-Si-Si[O.sub.x] nanostructures by Michailovska, E.V, Indutnyi, I.Z, Shepeliavyi, P.E, Sopinskii, N.V

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Investigation of thermal sensitivity and radiation resistance of SiOx〈Ti〉 metal-dielectric films by Shepeliavyi, P.E., Indutnyi, I.Z., Dan’ko, V.A., Neimash, V.B., Povarchuk, V.Yu

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Enhancing sensitivity of SPR sensors by using nanostructured Au chips coated with functional plasma polymer nanofilms by Indutnyi, I.Z.

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Visible photoluminescence of selectively etched porous nc-Si-Si[O.sub.x] structures by Indutnyi, I.Z, Michailovska, E.V, Shepeliavyi, P.E, Dan'ko, V.A

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Ellipsometric characterization of SiOx films with embedded Si nanoparticles by Szekeres, A., Vlaikova, E., Lohner, T., Petrik, P., Huhn, G., Havancsak, K., Lisovskyy, I., Zlobin, S., Indutnyy, I.Z., Shepeliavyi, P.E.

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Distribution of CdSe nanoparticles synthesized in porous Si[O.sub.x] matrix by Bacherikov, Yu. Yu, Indutnyi, I.Z, Okhrimenko, O.B, Optasyuk, S.V, Shepeliavyi, P.E, Ponamarenko, V.V

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Effect of Si nanoparticles embedded in SiOx on optical properties of the films studied by spectroscopic ellipsometry and photoluminescence spectroscopy by Szekeres, A., Nikolova, T., Paneva, A., Lisovskyy, I., Shepeliavyi, P.E., Rudko, G.Yu

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Ellipsometric characterization of SiO x films with embedded Si nanoparticles by Szekeres, A., Vlaikova, E., Lohner, T., Petrik, P., Huhn, G., Havancsak, K., Lisovskyy, I., Zlobin, S., Indutnyy, I.Z., Shepeliavyi, P.E.

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Raman spectra of Ag- and Cu-photo-doped As40S60-xSex films by STRONSKI, A. V, VLCEK, M, STETSUN, A. I, SKLENAR, A, SHEPELIAVYI, P. E

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Raman spectra of Ag- and Cu-photo-doped As 40S 60−xSe x films by Stronski, A.V, Vlček, M, Stetsun, A.I, Sklenař, A, Shepeliavyi, P.E

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