X-ray fluorescence of layered synthetic materials with interfacial roughness by KROL, A, SHER, C. J, KAO, Y. H

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Investigation of interfacial roughness of In sub x Ga sub 1 minus x As epitaxial layers on GaAs and InP substrates by soft x-ray reflectivity by Krol, A., Resat, H., Sher, C.J., Woronick, S.C., Ng, W., Kao, Y.H., Cole, T.L., Green, A.K., Lowe-Ma, C.K., Nee, T., Rehn, V.

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Soft x-ray investigation of the effect of growth conditions on InAs/GaAs heterostructures by Krol, A., Sher, C.J., Storch, D.R., Woronick, S.C., Kao, Y.H., Chang, L.L., Munekata, H.

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Effects of silver doping in the high-T sub / c/ superconductor system Y-Ba-Cu-O by Kao, Y-H, Yao, Y-D, Jang, L-Y

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X-ray studies of interfacial roughness in [formula omitted] heterostructures by Krol, A., Sher, C.J., Woronick, S.C., Kao, Y.H., Dalby, R.J., Cammack, D.A., Bhargava, R.N.

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X-ray-absorption studies of Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O films at oxygen K edge by means of fluorescence and total electron yield : a comparison of two techniques by KROL, A, LIN, C. S, SHAW, D. T, MING, Z. H, SHER, C. J, KAO, Y. H, CHEN, C. T, SETTE, F, MA, Y, SMITH, G. C, ZHU, Y. Z

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X-ray-absorption studies of Nd sub 2 minus x Ce sub x CuO sub 4 by Krol, A., Lin, C.S., Ming, Z.H., Sher, C.J., Kao, Y.H., Lin, C.L., Qiu, S.L., Chen, J., Tranquada, J.M., Strongin, M., Smith, G.C., Tao, Y.K., Meng, R.L., Hor, P.H., Chu, C.W., Cao, G., Crow, J.E.

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