Search Results - Shiau, Wei-Tsun

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  1. 1
    Optimization of Active Geometry Configuration and Shallow Trench Isolation (STI) Stress for Advanced CMOS Devices

    Optimization of Active Geometry Configuration and Shallow Trench Isolation (STI) Stress for Advanced CMOS Devices by Lin, Tony, Gong, Yoyi, Tseng, Jung-Tsung, Yu, Lorenzo, Shen, Tzermin, Chen, Daniel, Chen, T. P., Kuo, Chien-Li, Shiau, Wei-Tsun, Jung, Le-Tien, Chen, J. K., Chien, S. C., Sun, S. W.

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  2. 2
    Bias-temperature stability of nitrided oxides and reoxidized nitrided oxides

    Bias-temperature stability of nitrided oxides and reoxidized nitrided oxides by WEI-TSUN SHIAU, TERRY, F. L. JR

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  3. 3
    A novel high aspect ratio FinFET with cobalt fully silicided gate structure

    A novel high aspect ratio FinFET with cobalt fully silicided gate structure by Wen-Shiang Liao, Chih-Ning Wu, Shiao-Shien Chen, Chia-Rung Hsu, Wei-Tsun Shiau

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  4. 4
    Reliability investigation upon 30 nm gate length ultra-high aspect ratio FinFETs

    Reliability investigation upon 30 nm gate length ultra-high aspect ratio FinFETs by Wen-Shiang Liao, Shiao-Shien Chen, Chiang, S., Wei-Tsun Shiau

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  5. 5
    Hot carrier induced HFE degradation in BiCMOS transistors

    Hot carrier induced HFE degradation in BiCMOS transistors by Varker, C.J., Pettengill, D., Shiau, W.-T., Reuss, B.

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  6. 6
    Salicides and alternative technologies for future ICs

    Salicides and alternative technologies for future ICs by Kittl, Jorge A, Shiau, Wei-Tsun, Miles, Donald, Violette, Katherine E, Hu, Jerry C, Hong, Qi-Zhong

    Published in Solid state technology
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  7. 7
    Salicides and alternative technologies for future ICs: part I

    Salicides and alternative technologies for future ICs: part I by Kittl, Jorge A, Shiau, Wei-Tsun, Miles, Donald, Violette, Katherine E, Hu, Jerry C, Hong, Qi-Zhong

    Published in Solid state technology
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