Search Results - Shreeman, P. K.

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  1. 1
    Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures

    Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures by Shreeman, P. K., Dunn, K. A., Novak, S. W., Matyi, R. J.

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  2. 2
    Implementation of statistical dynamic diffraction theory for defective semiconductor heterostructure modelling

    Implementation of statistical dynamic diffraction theory for defective semiconductor heterostructure modelling by Shreeman, P. K., Matyi, R. J.

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  3. 3
    Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures

    Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures by Shreeman, P. K., Matyi, R. J.

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  4. 4
    Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures

    Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures by Shreeman, P K, Matyi, R J

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  5. 5
    Correlation between interfacial electronic structure and mechanical properties of ZrN-Me ( Me  Ag , Au, or Pd) nanocomposite films

    Correlation between interfacial electronic structure and mechanical properties of ZrN-Me ( Me  Ag , Au, or Pd) nanocomposite films by Aouadi, S. M., Shreeman, P. K., Ge, Q., Xu, J., Mishra, S. R.

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  6. 6
    Real-time spectroscopic ellipsometry study of ultrathin diffusion barriers for integrated circuits

    Real-time spectroscopic ellipsometry study of ultrathin diffusion barriers for integrated circuits by Aouadi, S. M., Shreeman, P. K., Williams, M.

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  7. 7
    Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures : High-resolution X-ray Diffraction and Imaging

    Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures : High-resolution X-ray Diffraction and Imaging by SHREEMAN, P. K, MATYI, R. J

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