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Identification of the possible defect states in poly(3-hexylthiophene) thin films
by
Feng, D.-Q.
,
Caruso, A.N.
,
Losovyj, Y.B.
,
Shulz, D.L.
,
Dowben, P.A.
Published in
Polymer engineering and science
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Polymer Engineering And Science
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Spe Transactions/Polymer Engineering And Science
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Applied Sciences
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Chemical Properties
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Polymers
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Semiconductor Films
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Structure, Morphology And Analysis
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Thin Films
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Thiophene
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