Search Results - Siangchaew, Krisda

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  1. 1
    Measurement of Interfacial Width in a Poly(styrene)/Poly(2-vinylpyridine) Homopolymer Blend by Spatially Resolved Inelastic Electron Scattering

    Measurement of Interfacial Width in a Poly(styrene)/Poly(2-vinylpyridine) Homopolymer Blend by Spatially Resolved Inelastic Electron Scattering by Siangchaew, Krisda, Libera, Matthew

    Published in Macromolecules
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  2. 2
    Characterisation of C–F Polymer Film Formation on the Air-Bearing Surface Etched Sidewall of Fluorine-Based Plasma Interacting with AL2O3–TiC Substrate

    Characterisation of C–F Polymer Film Formation on the Air-Bearing Surface Etched Sidewall of Fluorine-Based Plasma Interacting with AL2O3–TiC Substrate by Siangchaew, Krisda, Pakpum, Chupong, Patthanasettakul, V., Limcharoen, Alonggot

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  3. 3
    Characterisation of C-F Polymer Film Formation on the Air-Bearing Surface Etched Sidewall of Fluorine-Based Plasma Interacting with AL2 O3 -TiC Substrate

    Characterisation of C-F Polymer Film Formation on the Air-Bearing Surface Etched Sidewall of Fluorine-Based Plasma Interacting with AL2 O3 -TiC Substrate by Limcharoen, Alonggot, Limsuwan, Pichet, Pakpum, Chupong, Siangchaew, Krisda

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  4. 4
    Characterisation of C–F Polymer Film Formation on the Air‐Bearing Surface Etched Sidewall of Fluorine‐Based Plasma Interacting with AL 2 O 3 –TiC Substrate

    Characterisation of C–F Polymer Film Formation on the Air‐Bearing Surface Etched Sidewall of Fluorine‐Based Plasma Interacting with AL 2 O 3 –TiC Substrate by Limcharoen, Alonggot, Limsuwan, Pichet, Pakpum, Chupong, Siangchaew, Krisda

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  5. 5
    Electrochemical Impedance Characterization of Ultra-Thin Carbon Overcoats

    Electrochemical Impedance Characterization of Ultra-Thin Carbon Overcoats by Kobsiriphat, Worawarit, Supadee, Laddawan, Siangchaew, Krisda

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    Conference Proceeding
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  6. 6
    Critical thickness of diamond-like carbon study using X-ray photoelectron spectroscopy depth profiling

    Critical thickness of diamond-like carbon study using X-ray photoelectron spectroscopy depth profiling by Khamnaulthong, N., Siangchaew, K., Limsuwan, P.

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