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    Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

    Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST) by Marshall, P., Carts, M., Currie, S., Reed, R., Randall, B., Fritz, K., Kennedy, K., Berg, M., Krithivasan, R., Siedleck, C., Ladbury, R., Marshall, C., Cressler, J., Guofu Niu, LaBel, K., Gilbert, B.

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