Search Results - Sien, Seah Soo

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  1. 1
    Explosion phenomenon of high resistance via during TEM sample preparation using FIB

    Explosion phenomenon of high resistance via during TEM sample preparation using FIB by Pan Liu, Tee, I, Soo Sien Seah, Chi Wen Soo, Ye Chen, Zhi Qiang Mo

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  2. 2
    Phase and microstructure analysis by electron diffraction in semiconductor failure analysis

    Phase and microstructure analysis by electron diffraction in semiconductor failure analysis by Binghai Liu, Zhiqiang Mo, Qiang Lei, Soo Sien Seah, Chen Ye, Lee Gek Li, Chen Changqing, Chong Khiam Oh

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    Study on the impact of barrier metal deposition processes on W Via/CA ET high resistance by TEM failure analysis

    Study on the impact of barrier metal deposition processes on W Via/CA ET high resistance by TEM failure analysis by Liu, Binghai, Irene, Tee, Sien, Seah Soo, Ye, Chen, Elizabeth, Jie, Zhu, Er, Eddie, Zhao, Si Ping, Lam, Jeffery

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