Symmetrical current–voltage characteristic of a metal–semiconductor–metal structure of Schottky contacts and parameter retrieval of a CdTe structure by Elhadidy, H, Sikula, J, Franc, J

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Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors by Kuberský, P., Sedlák, P., Hamáček, A., Nešpůrek, S., Kuparowitz, T., Šikula, J., Majzner, J., Sedlaková, V., Grmela, L., Syrový, T.

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Diagnostic confidence and image quality of CT pulmonary angiography at 100 kVp in overweight and obese patients by Megyeri, B, Christe, A, Schindera, S.T, Horkay, E, Sikula, J, Cullmann, J.L, Kollar, J, Heverhagen, J.T, Szucs-Farkas, Z

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Acoustic and electromagnetic emission as a tool for crack localization by Sedlak, P, Sikula, J, Lokajicek, T, Mori, Y

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Contact quality analysis and noise sources determination of CdZnTe-based high-energy photon detectors by Sik, O, Skarvada, P, Grmela, L, Elhadidy, H, Vondra, M, Sikula, J, Franc, J

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Characterization of acoustic and electromagnetic emission sources by Koktavy, P, Pavelka, J, Sikula, J

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Investigation of excess 1/f noise in CdTe single crystals by Andreev, A, Grmela, L, Moravec, P, Bosman, G, Sikula, J

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Processing of waste from pulp and paper plant by Oral, J., Sikula, J., Puchyr, R., Hajny, Z., Stehlik, P., Bebar, L.

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Study of electric field distribution and low frequency noise of CdZnTe radiation detectors by Sik, O, Grmela, L, Elhadidy, H, Dedic, V, Sikula, J, Grmela, P, Franc, J, Skarvada, P, Holcman, V

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Low-frequency-noise monitoring of current collapse in AlGaN/GaN high-electron-mobility transistors on sapphire substrate by Tanuma, N, Tacano, M, Yagi, S, Sikula, J

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Noise in Piezoceramics by Majzner, J, Sedlak, P, Strunc, M, Sikula, J

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Mathematical Model for Electrical Noise of Piezoelectric Sensor by Sedlak, P, Majzner, J, Sikula, J

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Experimental Analysis of Noise in CdTe Radiation Detectors by Andreev, A, Grmela, L, Raska, M, Sikula, J, Moravec, P

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PO10-TU-50 Hungarian long term experience of natalizumab in multiple sclerosis patients from clinical trials by Csepany, T, Sikula, J, Jakab, G, Guseo, A, Rum, G, Csanyi, A, Matolcsi, J, Rozsa, C, Dobos, E, Harcos, P, Kanya, J, Dioszeghy, P, Csiba, L, Komoly, S

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RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position by Sikula, J, Sedlakova, V, Chvatal, M, Pavelka, J, Tacano, M, Toita, M

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Low-Frequency Noise Characteristics of InGaAs/InAlAs Heterostructures by Pavelka, J, Tanuma, N, Tacano, M, Sikula, J, Handel, P H

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Current Collapse and Deep Levels of AlGaN/GaN Heterostructures monitored by LFN Measurements by Tacano, M, Tanuma, N, Yagi, S, Okumura, H, Matsui, T, Sikula, J

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Noise and Electro-Ultrasonic Spectroscopy of Polymer Based Conducting Layers by Sedlakova, V, Majzner, J, Sikula, J

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NDT of Conducting Solids by Electro-Ultrasonic Spectroscopy by Sikula, J, Sedlakova, V, Navarova, H, Tofel, P, Majzner, J, Hajek, K

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Noise Sources in the CdTe radiation detectors by Grmela, L, Zajacek, J, Andreev, A, Sikula, J, Moravec, P

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