Search Results - Silfhout, R.G. van

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  1. 1
    Compact and portable X-ray imager system using Medipix3RX

    Compact and portable X-ray imager system using Medipix3RX by Garcia-Nathan, T.B., Kachatkou, A., Jiang, C., Omar, D., Marchal, J., Changani, H., Tartoni, N., Silfhout, R.G. van

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  2. 2
    Performance of the Lancelot Beam Position Monitor at the Diamond Light Source

    Performance of the Lancelot Beam Position Monitor at the Diamond Light Source by Chagani, H., Garcia-Nathan, T.B., Jiang, C., Kachatkou, A., Marchal, J., Omar, D., Tartoni, N., Silfhout, R.G. van, Williams, S.

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  3. 3
    Fibre-optic coupling to high-resolution CCD and CMOS image sensors

    Fibre-optic coupling to high-resolution CCD and CMOS image sensors by van Silfhout, R.G., Kachatkou, A.S.

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  4. 4
    A compact and portable X-ray beam position monitor using Medipix3

    A compact and portable X-ray beam position monitor using Medipix3 by Rico-Alvarez, O., Kachatkou, A., Marchal, J., Willis, B., Sawhney, K., Tartoni, N., Silfhout, R.G. van

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  5. 5
    In situ high-speed synchrotron X-ray beam profiling and position monitoring

    In situ high-speed synchrotron X-ray beam profiling and position monitoring by van Silfhout, R.G., Manolopoulos, S., Kyele, N.R., Decanniere, K.

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  6. 6
    An X-ray diffraction study of the Si(111) (√3 × √3) R30°-indium reconstruction

    An X-ray diffraction study of the Si(111) (√3 × √3) R30°-indium reconstruction by Finney, M.S., Norris, C., Howes, P.B., van Silfhout, R.G., Clark, G.F., Thornton, J.M.C.

    Published in Surface science
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  7. 7
    Asymmetrical dimers on the Ge(001)-2 × 1-Sb surface observed using X-ray diffraction

    Asymmetrical dimers on the Ge(001)-2 × 1-Sb surface observed using X-ray diffraction by Lohmeier, Martin, van der Vegt, H.A., van Silfhout, R.G., Vlieg, E., Thornton, J.M.C., Macdonald, J.E., Scholte, P.M.L.O.

    Published in Surface science
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  8. 8
    A beam tracking optical table for synchrotron X-ray beamlines

    A beam tracking optical table for synchrotron X-ray beamlines by van Silfhout, R.G.

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  9. 9
    Strain relaxation during the surfactant modified epitaxial growth of Ge/Si(001)

    Strain relaxation during the surfactant modified epitaxial growth of Ge/Si(001) by Thornton, J.M.C., Williams, A.A., Macdonald, J.E., van Silfhout, R.G., Finney, M.S., Norris, C.

    Published in Surface science
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  10. 10
    An X-ray diffraction study of the Si(111)(√3 × √3)R30°-indium reconstruction

    An X-ray diffraction study of the Si(111)(√3 × √3)R30°-indium reconstruction by Finney, M.S., Norris, C., Howes, P.B., van Silfhout, R.G., Clark, G.F., Thornton, J.M.C.

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