Search Results - Simon, P.L.C.

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  1. 1
    Calibration of open interconnect yield models

    Calibration of open interconnect yield models by de Vries, D.K., Simon, P.L.C.

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  2. 2
    Autocalibration of silicon Hall devices

    Autocalibration of silicon Hall devices by Simon, P.L.C., de Vries, P.H.S., Middelhoek, S.

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  3. 3
    Autocalibration Of Silicon Hall Devices

    Autocalibration Of Silicon Hall Devices by Simon, P.L.C., de Vries, P.H.S., Middelhoek, S.

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    Multiplexed antenna monitoring test structure [plasma charging damage]

    Multiplexed antenna monitoring test structure [plasma charging damage] by Simon, P.L.C., Maly, W., Luchies, J.R.M., Antheunis, R.

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    Design dependency of yield loss due to tungsten residues in spin on glass based planarization processes

    Design dependency of yield loss due to tungsten residues in spin on glass based planarization processes by Simon, P.L.C., Maly, W., de Vries, D.K., Bruls, E.

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