Consumer Electronics Opportunities in Remote and Home Healthcare by Simons, D.P.L.

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PIXE monitoring of diffusion during photo-polymerization by Leewis, C.M, Simons, D.P.L, de Jong, A.M, Broer, D.J, de Voigt, M.J.A

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Indium diffusion in model polymer light-emitting diodes by de Jong, M.P, Simons, D.P.L, Reijme, M.A, van IJzendoorn, L.J, Denier van der Gon, A.W, de Voigt, M.J.A, Brongersma, H.H, Gymer, R.W

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The distribution of InCl x compounds in model polymeric LEDs: A combined low and high-energy ion beam analysis study by Reijme, M.A., de Jong, M.P., Simons, D.P.L., Schok, M., van IJzendoorn, L.J., Denier van der Gon, A.W., Brongersma, H.H., de Voigt, M.J.A.

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The distribution of InClx compounds in model polymeric LEDs: A combined low and high-energy ion beam analysis study by Reijme, M.A., de Jong, M.P., Simons, D.P.L., Schok, M., van IJzendoorn, L.J., Denier van der Gon, A.W., Brongersma, H.H., de Voigt, M.J.A.

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A multi-parameter system for acquisition, monitoring, and analysis of scanning ion microprobe data by Mutsaers, P.H.A., Simons, D.P.L.

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Verification of a uranium micromass standard using the Eindhoven Scanning Microprobe by Simons, D.P.L, Lagerwaard, A, Mutsaers, P.H.A, de Voigt, M.J.A

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Study of localised radiation damage to PIPS detectors by a scanning ion microprobe: Measured effects and the consequences for STIM analysis by Simons, D.P.L., Maas, A.J.H., Mutsaers, P.H.A., de Voigt, M.J.A.

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Exploration of X-ray and charged-particle spectroscopy with CCDs and PSDs by Simons, D.P.L., Mutsaers, P.H.A., van IJzendoorn, L.J., de Voigt, M.J.A.

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Recoil selection by pulse shape discrimination in elastic recoil detection analysis with α-particles (α-ERDA) by Maas, A.J.H., Klein, S.S., Simons, D.P.L., de Voigt, M.J.A.

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