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Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET
by
Gupta, Aniket
,
Bajpai, Govind
,
Singhal, Priyanshi
,
Bagga, Navjeet
,
Prakash, Om
,
Banchhor, Shashank
,
Amrouch, Hussam
,
Chauhan, Nitanshu
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Cyberattack Analysis, Detection and Prevention using Machine Learning
by
Ranjane, Gayatri Dattatraya
,
Joshi, Vishwa Hiteshkumar
,
Singhal, Priyanshi Lokesh Kumar
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International journal for research in applied science and engineering technology
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Conference Proceedings
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International Journal For Research In Applied Science And Engineering Technology
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Subjects
Aging
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1
Bulk Traps
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1
Capacitance
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Electric Fields
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Multidisciplinary
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Ferroelectric
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Ferroelectricity
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Field Effect Transistors
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Induced Polarization
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Interface Traps
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Negative Capacitance
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Performance Degradation
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Performance Evaluation
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Physical Sciences
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Physics
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Physics, Applied
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Polarization Switching
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Reliability Analysis
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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Freely Accessible Journals
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Road: Directory Of Open Access Scholarly Resources
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