Search Results - Singkh, S. P.

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  1. 1
    Spectral ellipsometry as a method for characterization of nanosized films with ferromagnetic layers

    Spectral ellipsometry as a method for characterization of nanosized films with ferromagnetic layers by Hashim, H., Singkh, S. P., Panina, L. V., Pudonin, F. A., Sherstnev, I. A., Podgornaya, S. V., Shpetnyi, I. A., Beklemisheva, A. V.

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  2. 2
    Validity and accuracy of a mobile phone application for the assessment of wounds in recessive dystrophic epidermolysis bullosa

    Validity and accuracy of a mobile phone application for the assessment of wounds in recessive dystrophic epidermolysis bullosa by Nazaroff, Jaron, Solis, Daniel, Barriga, Melissa, Dutt-Singkh, Yana, Li, Shufeng, Marinkovich, Peter M., Tang, Jean Y.

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  3. 3
    F19 chemical shifts in the DF-D2O and DF-H2O-D2O systems

    F19 chemical shifts in the DF-D2O and DF-H2O-D2O systems by Borodin, P. M., Singkh, R., Shcherbakov, V. A.

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