Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry by Paillard, V., Puech, P., Sirvin, R., Hamma, S., Roca i Cabarrocas, P.

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Strain and composition in self-assembled SiGe islands by Raman spectroscopy by Cazayous, M., Groenen, J., Demangeot, F., Sirvin, R., Caumont, M., Remmele, T., Albrecht, M., Christiansen, S., Becker, M., Strunk, H. P., Wawra, H.

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Non-stoichiometry in (001) low temperature GaAs by Raman spectroscopy by Puech, P, Toufella, M, Carles, R, Sirvin, R, Bedel, E, Fontaine, C, Stellmacher, M, Bisaro, R, Nagle, J, Claverie, A, Benassayag, G

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Band-gap dynamics and nonlinear propagation of optical pulses in CdTe by COLLET, J. H, PUGNET, M, RÜHLE, W. W, NARDO, L, SIRVIN, R

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Magnetic freeze-out study of the DX-linked shallow level in Si-doped AlxGa1-xAs under hydrostatic pressure by Kadri, A, Ranz, E, Zitouni, K, Saidi, N, Portal, J C, Lavielle, D, Sirvin, R, Grattepain, C, Chand, N

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Magnetic freeze-out study of the DX-linked shallow level in Si-doped Al x Ga 1-x As under hydrostatic pressure by Kadri, A, Ranz, E, Zitouni, K, Saidi, N, Portal, J C, Lavielle, D, Sirvin, R, Grattepain, C, Chand, N

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Mechanical behavior and modelisation of Ti-6Al-4V titanium sheet under hot stamping conditions by Sirvin, Q., Velay, V., Bonnaire, R., Penazzi, L.

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Oxygen/nitrogen-assisted embrittlement of titanium alloys exposed at elevated temperature by Texier, D., Sirvin, Q., Velay, V., Salem, M., Monceau, D., Mazères, B., Andrieu, E., Roumiguier, R., Dod, B.

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